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Modelling and mitigation of soft-errors in CMOS processors

机译:CMOS处理器中的软错误建模和缓解

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摘要

The topic of this thesis is about soft-errors in digital systems. Different aspects of soft-errors have been addressed here, including an accurate simulation model to emulate soft-errors in a gate-level net list, a simulation framework to study the impact of soft-errors in a VHDL design and an efficient architecture to minimize the impact of soft-errors in a DSP processor. The first two chapters of this thesis introduce the basic knowledge with regard to soft-errors. Chapter three introduces a simulation framework to study the impact of soft-errors in complex digital systems modelled in VHDL language. This framework has been introduced to resolve the enormous CPU time typically required in simulation-based soft-error experiments. Chapter four introduces two realistic simulation models that can emulate the impact of soft-errors in a 45-nm CMOS technology node at a gate level. One of the determination approaches has been extracted from radiation testing along with using a transistor-level soft-error analysis tool. Another approach has been developed by analysing the behaviour of soft-errors in a 45-nm CMOS technology node. In chapter 5, some unique features of DSP processors have been exploited to introduce a low-overhead soft-error mitigation architecture to minimize the impact of soft-errors in a DSP processor. This mitigation technique concerns unstructured parts of a processor (such as the control unit and data path). The unique features of DSP processors are existence of several functional units, a limited number of different opcodes in each functional unit and also highly-repetitive instruction flow in a DSP workload. Moreover, the mitigation method which has been developed for a single core has been applied to a multi-core environment in chapter 6 to propose a soft-error mitigation technique for multi-core architectures. Overall, based on simulated data and experiments, this thesis proposes a methodology to investigate the impact of soft-errors during the design phase of a digital system.
机译:本文的主题是关于数字系统中的软错误。这里讨论了软错误的不同方面,包括在门级网表中模拟软错误的精确仿真模型,研究VHDL设计中软错误影响的仿真框架以及有效地将软错误最小化的体系结构。 DSP处理器中软错误的影响。本文的前两章介绍了有关软错误的基本知识。第三章介绍了一个仿真框架,以研究软错误对以VHDL语言建模的复杂数字系统的影响。引入此框架是为了解决基于仿真的软错误实验通常需要的大量CPU时间。第四章介绍了两个现实的仿真模型,它们可以在栅极级仿真45 nm CMOS技术节点中软错误的影响。从辐射测试中提取了一种确定方法,并使用了晶体管级软误差分析工具。通过分析45纳米CMOS技术节点中的软错误的行为,已经开发出另一种方法。在第5章中,已利用DSP处理器的某些独特功能来引入低开销的软错误缓解架构,以最大程度地减小DSP处理器中的软错误的影响。此缓解技术涉及处理器的非结构化部分(例如控制单元和数据路径)。 DSP处理器的独特功能是存在多个功能单元,每个功能单元中有限数量的不同操作码,以及DSP工作负载中的高度重复的指令流。此外,第6章将针对单核开发的缓解方法应用于多核环境,以提出一种针对多核体系结构的软错误缓解技术。总体而言,本文基于仿真数据和实验,提出了一种在数字系统设计阶段研究软错误影响的方法。

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    Rohani, A.;

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  • 年度 2014
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